| The tags must undergo adequate stress tests within the proposed temperature processes before deployment., The following stress test was performed on this tag:?Cyclic temperature stress: 5 min at -40 °C – 5 min at 90 °C?Number of tested cycles: 100, transition period: 30 seconds?Continuous load: 140 °C for 100 hours, This successfully performed test does not imply suitability for a specific application, but merely serves as proof of the basic usability., EEPROM, memory 128 byte, Not for direct mounting on metal |
| Plastic active face material, housing material |
| NXP I-Code SLI/SL2 chip |
| Unlimited number of read operations |
| 10^5 write operations |
| 2 ms/byte typical read time |
| 3 ms/byte typical write time |
| IP69K degree of protection |
| -25 to 85 deg C ambient temperature |
| -45 to 85 deg C storage temperature |
